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Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/10215

Title: Space charge and associated electroluminescence processes in XLPE cable peelings
Authors: Laurent, C.
Teyssedre, G.
Auge, J. L.
Mazzanti, G.
Montanari, G. C.
Dissado, Len A.
Fothergill, John C.
See, A.
Issue Date: Oct-2000
Presented at: 69th Annual Conference on Electrical Insulation and Dielectric Phenomena, Victoria, Canada, 15-18 October 2000.
Start Date: 15-Oct-2000
End Date: 18-Oct-2000
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: Electrical Insulation and Dielectric Phenomena, 2000 Annual Report, Conference on , Vol. 2, pp. 568-572
Abstract: The intent of this paper is to cross-correlate the information obtained by space charge profile analysis and electroluminescence (EL) detection in cross-linked polyethylene samples submitted to dc fields, with the objective to make a link between space charge phenomena and energy release as revealed by detection of visible photons. Space charge measurements carried out at different electrical fields by the pulsed electro-acoustic method show the presence of a low-field threshold, close to 15 to 20 kV/mm, above which space charge begins to accumulate considerably in the insulation. Charges are seen to cross the insulation thickness through a packet-like behavior at higher fields, starting at about 60 to 70 kV/mm. EL measurements show the existence of two distinct thresholds, one related to the permanent excitation of EL under voltage, the other being transient EL detected upon specimen short-circuit. The former occurs at values of field corresponding to space charge packet formation, and the latter to the onset of space charge accumulation. The two techniques give therefore consistent information on space charge phenomena and associated energy release in the optical EM spectrum.
DOI Link: 10.1109/CEIDP.2000.884024
ISBN: 0-7803-6413-9
Links: http://ieeexplore.ieee.org/xpls/abs_all.jsp?a(...)
http://hdl.handle.net/2381/10215
Version: Post-print
Status: Peer-reviewed
Type: Conference Paper
Rights: Copyright © 2000 IEEE. Deposited with reference to the publisher's archiving policy available on the SHERPA/RoMEO website. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
Appears in Collections:Conference Papers & Presentations, Dept. of Engineering

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