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|Title: ||Electrical, microstructural, physical and chemical characterization of HV XLPE cable peelings for an electrical aging diagnostic data base|
|Authors: ||Fothergill, John C.|
Dissado, Len A.
|Issue Date: ||Jun-2003|
|Publisher: ||IEEE Dielectrics and Electrical Insulation Society|
|Citation: ||IEEE Transactions on Dielectrics and Electrical Insulation , 2003, 10 (3), pp. 514-527.|
|Abstract: ||The aim of the European project "ARTEMIS" is to develop a diagnostic system for assessing aging in power cable insulation. Its first task was to make a thorough characterisation of the cable insulation before aging. This is intended to provide a background against which any changes introduced by thermo-electric aging can be identified. The aging markers derived from this initial characterisation will be considered both as diagnostic indicators in their own right, and also to develop an aging model for predictive purposes, if and when possible. This stage of the ARTEMIS programme is now complete and we will present an analysis of the results, and show how they may be correlated with the concepts proposed in aging theories.|
|DOI Link: ||10.1109/TDEI.2003.1207480|
|Type: ||Journal Article|
|Rights: ||© 2003 IEEE Dielectrics and Electrical Insulation Society|
|Description: ||The full text of this paper is not available through the Leicester Research Archive.|
|Appears in Collections:||Published Articles, Dept. of Engineering|
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