Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/11854
Title: Applying MLP and RBF classifiers in embedded condition monitoring and fault diagnosis systems
Authors: Li, YH
Pont, MJ
Jones, NB
Twiddle, JA
First Published: 1-Jan-2001
Publisher: ARNOLD, HODDER HEADLINE PLC
Citation: TRANSACTIONS OF THE INSTITUTE OF MEASUREMENT AND CONTROL, 2001, 23 (5), pp. 315-343
DOI Link: 10.1177/014233120102300504
ISSN: 0142-3312
Links: http://hdl.handle.net/2381/11854
Type: Journal Article
Appears in Collections:Published Articles, Dept. of Engineering

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