Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/13834
Title: Improving the reliability of embedded systems as complexity increases: Supporting the migration between event-triggered and time-triggered software architectures
Authors: Lakhani, F
Pont, MJ
Das, A
First Published: 2011
Citation: ACM INTERNATIONAL CONFERENCE PROCEEDING SERIES, 2011
DOI Link: 10.1145/2328909.2328937
Links: http://hdl.handle.net/2381/13834
Type: Journal Article
Appears in Collections:Published Articles, Dept. of Engineering

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