Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/17821
Title: Metrology and modeling of microchannel plate x-ray optics
Authors: Brunton, AN
Fraser, GW
Lees, JE
Turcu, ICE
First Published: 1-Aug-1997
Publisher: OPTICAL SOC AMER
Citation: APPLIED OPTICS, 1997, 36 (22), pp. 5461-5470
DOI Link: 10.1364/AO.36.005461
ISSN: 0003-6935
Links: http://hdl.handle.net/2381/17821
Type: Journal Article
Appears in Collections:Published Articles, Dept. of Physics and Astronomy

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