Please use this identifier to cite or link to this item:
|Title:||Metrology and modeling of microchannel plate x-ray optics|
|Publisher:||OPTICAL SOC AMER|
|Citation:||APPLIED OPTICS, 1997, 36 (22), pp. 5461-5470|
|Appears in Collections:||Published Articles, Dept. of Physics and Astronomy|
Files in This Item:
There are no files associated with this item.
Items in LRA are protected by copyright, with all rights reserved, unless otherwise indicated.