Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/18640
Title: The impact of low energy proton damage on the operational characteristics of EPIC-MOS CCDs
Authors: Ambrosi, RM
Smith, DR
Abbey, AF
Hutchinson, IB
Short, A
Holland, A
Turner, MJL
Wells, A
Kendziorra, E
First Published: Jun-2003
Citation: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH, SECTION B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 207 (2), pp. 175-185
DOI Link: 10.1016/S0168-583X(03)00832-2
ISSN: 0168-583X
Links: http://hdl.handle.net/2381/18640
Type: Journal Article
Appears in Collections:Published Articles, Dept. of Physics and Astronomy

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