Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/18724
Title: The impact of low energy proton damage on the operational characteristics of EPIC-MOS CCDs (vol 204, pg 175, 2003)
Authors: Ambrosi, MR
Smith, DR
Abbey, AF
Hutchinson, IB
Kendziorra, E
Short, A
Holland, A
Turner, MJL
Wells, A
First Published: 1-Feb-2005
Publisher: ELSEVIER SCIENCE BV
Citation: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 229 (1), pp. 159-159
DOI Link: 10.1016/j.nimb.2004.11.027
ISSN: 0168-583X
Links: http://hdl.handle.net/2381/18724
Type: Journal Article
Appears in Collections:Published Articles, Dept. of Physics and Astronomy

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