Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/19479
Title: SIMULATION OF REFLECTION ELECTRON-MICROSCOPY IMAGES - APPLICATION TO HIGH-RESOLUTION IMAGING OF THE SI(001)2X1 SURFACE
Authors: MCCOY, JM
MAKSYM, PA
First Published: 20-Nov-1993
Publisher: ELSEVIER SCIENCE BV
Citation: SURFACE SCIENCE, 1993, 297 (2), pp. 113-126
DOI Link: 10.1016/0039-6028(93)90254-H
ISSN: 0039-6028
Links: http://hdl.handle.net/2381/19479
Type: Journal Article
Appears in Collections:Published Articles, Dept. of Physics and Astronomy

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