Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/21628
Title: Application of synchrotron X-ray diffraction and nanoindentation for the determination of residual stress fields around scratches
Authors: Khan, MK
Fitzpatrick, ME
Edwards, L
Hainsworth, SV
Evans, AD
Edwards, L
First Published: Dec-2011
Citation: ACTA MATERIALIA, 2011, 59 (20), pp. 7508-7520
DOI Link: 10.1016/j.actamat.2011.08.034
ISSN: 1359-6454
Links: http://hdl.handle.net/2381/21628
Type: Journal Article
Appears in Collections:Published Articles, Dept. of Engineering

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