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Title: Percolation model for electrical breakdown in insulating polymers
Authors: Wu, Kai
Dissado, Len A.
Okamoto, Tatsuki
First Published: 8-Nov-2004
Publisher: American Institute of Physics (AIP)
Citation: Applied Physics Letters, 2004, 85 (19), pp. 4454-4456 (3)
Abstract: It is suggested that an electric field above a given value eliminates the barriers to the transport of trapped charge carriers so as to produce an extended state in the form of a percolation cluster, and that the consequent current multiplication results in electrical breakdown. This model provides an estimated value of intrinsic breakdown strength close to the actual value. By considering the interactions between trap barrier potentials, the effect of electrical aging can be explained in terms of an increase in trap density. Many phenomena, such as the effect of weak points and the change of breakdown strength with the content of co-monomers or additives, can also be explained using this model.
DOI Link: 10.1063/1.1819526
ISSN: 0003-6951
eISSN: 1077-3118
Version: Publisher Version
Status: Peer-reviewed
Type: Journal Article
Rights: Copyright © 2004 American Institute of Physics. Deposited with reference to the publisher's archiving policy available on the SHERPA/RoMEO website. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2004, 85 (19), pp. 4454-4456 and may be found at
Appears in Collections:Published Articles, Dept. of Engineering

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