Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/27978
Title: Silicon Σ13 501 grain boundary interface structure determined by bicrystal Bragg rod x-ray scattering
Authors: Howes, Paul Bedford
Rhead, S.
Roy, Mervyn
Nicklin, C.L.
Rawle, J.L.
Norris, C.A.
First Published: 2013
Publisher: Elsevier Ltd
Citation: Acta Materialia, in press
Abstract: The atomic structure of the silicon Σ13(501) symmetric tilt grain boundary interface has been determined using Bragg rod x-ray scattering. In contrast to conventional structural studies of grain boundary structure using transmission electron microscopy this approach allows the non-destructive measurement of macroscopic samples. The interface was found to have a single structure that is fully four-fold coordinated. X-ray diffraction data were measured at Beamline I07 at the Diamond Light Source.
ISSN: 1359-6454
Links: http://www.sciencedirect.com/science/journal/13596454
http://hdl.handle.net/2381/27978
Version: Post-print
Status: Peer-reviewed
Type: Journal Article
Rights: © 2013, Elsevier Ltd. Deposited with reference to the publisher’s archiving policy available on the SHERPA/RoMEO website.
Description: The file associated with this record is embargoed until 24 months after the date of publication. The final published version may be available through the links above.
Appears in Collections:Published Articles, Dept. of Physics and Astronomy

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