Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/38672
Title: Reliability and performance enhancements for SSD RAID
Authors: McEwan, Alistair A.
Komsul, Muhammed Ziya
First Published: 18-Nov-2016
Publisher: Elsevier
Citation: Microprocessors and Microsystems, 2016
Abstract: NAND based solid state storage devices are almost ubiquitously used in safety-critical embedded devices, and recent advances have demonstrated RAID architectures specific to solid state storage devices resulting in increased data reliability, with architectural enhancements to solve the age convergence problem. However, these techniques require devices to be taken off-line while components are replaced—consequently these devices are of limited use in hard real time systems. There are further real time issues in that the conventional architectures ignore other characteristics of solid state devices such as garbage collection and meta data management. In this paper we investigate techniques that support the replacement of aged devices in the array in such a way that we provide continuous system reliability. We also improve the performance overhead of the reconstruction process using a novel data migration policy. The techniques are implemented and tested in a trace-driven simulator, and results demonstrate that average I/O response time is improved by up to 39% with improvement by up to 45% in its standard deviation, overheads in terms of device replacement time are negligible, and read performance is improved by an average of 8%.
DOI Link: 10.1016/j.micpro.2016.11.012
ISSN: 0141-9331
eISSN: 1872-9436
Links: http://www.sciencedirect.com/science/article/pii/S0141933116303635
http://hdl.handle.net/2381/38672
Embargo on file until: 18-Nov-2017
Version: Post-print
Status: Peer-reviewed
Type: Journal Article
Rights: Creative Commons “Attribution Non-Commercial No Derivatives” licence CC BY-NC-ND, further details of which can be found via the following link: http://creativecommons.org/licenses/by-nc-nd/4.0/ Archived with reference to SHERPA/RoMEO and publisher website.
Appears in Collections:Published Articles, Dept. of Engineering

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