Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/4054
Title: Material morphology and energy barriers to electrical ageing.
Authors: Cooper, Elizabeth S.
Fothergill, John C.
Dissado, Len A.
Hampton, R.N.
First Published: 25-Jun-2001
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics, pp. 260-263
Abstract: A distribution of the parameters representing activation energy of the ageing process within the Dissado-Montanari-Mazzanti (DMM) lifetime model has been shown to model experimental lifetime distributions of PET films well. The results imply small differences in the local environments of the moieties involved in the ageing process. Very small changes in the minimum activation energy values have a pronounced effect on the resultant lifetimes of polymer specimens. Changes in the distributions of activation energies with field and temperature can be explained by assuming the ageing process to be one whereby polymer segments on lamella surfaces crystallise to create free volume within the polymer.
DOI Link: 10.1109/ICSD.2001.955615
ISSN: 0780363523
Links: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=955615
http://hdl.handle.net/2381/4054
Type: Conference paper
Rights: This is the author's final draft of the paper published as Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics, pp. 260-263. Copyright © 2001 IEEE. The final version is available from http://ieeexplore.ieee.org/. Doi: 10.1109/ICSD.2001.955615. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Leicester’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
Appears in Collections:Conference Papers & Presentations, Dept. of Engineering

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