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dc.contributor.authorCooper, Elizabeth S.-
dc.contributor.authorFothergill, John C.-
dc.contributor.authorDissado, Len A.-
dc.contributor.authorHampton, R.N.-
dc.identifier.citationProceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics, pp. 260-263en_GB
dc.description.abstractA distribution of the parameters representing activation energy of the ageing process within the Dissado-Montanari-Mazzanti (DMM) lifetime model has been shown to model experimental lifetime distributions of PET films well. The results imply small differences in the local environments of the moieties involved in the ageing process. Very small changes in the minimum activation energy values have a pronounced effect on the resultant lifetimes of polymer specimens. Changes in the distributions of activation energies with field and temperature can be explained by assuming the ageing process to be one whereby polymer segments on lamella surfaces crystallise to create free volume within the polymer.en_GB
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_GB
dc.rightsThis is the author's final draft of the paper published as Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics, pp. 260-263. Copyright © 2001 IEEE. The final version is available from Doi: 10.1109/ICSD.2001.955615. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Leicester’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to By choosing to view this document, you agree to all provisions of the copyright laws protecting it.-
dc.titleMaterial morphology and energy barriers to electrical ageing.en_GB
dc.typeConference paperen_GB
Appears in Collections:Conference Papers & Presentations, Dept. of Engineering

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