Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/4067
Title: Photoluminescence, recombination induced luminescence and electroluminescence in epoxy resin.
Authors: Griseri, Virginie
Dissado, Len A.
Fothergill, John C.
First Published: 21-Aug-2001
Publisher: Institute of Physics
Citation: Journal of Physics D: Applied Physics, 2001, 34 (16), pp. 2534-2540
Abstract: Dielectric breakdown of epoxies is preceded by light emission, or so-called electroluminescence, from the solid-state material. Very little is known about the luminescence properties of epoxies. The aim of this paper is to derive information that can be used as a basis to understand the nature of the excited states and their involvement in electrical degradation processes. Three different kinds of stimulation were used to excite the material luminescence. Photoluminescence was performed on the base resin, the hardener and the cured resin. Luminescence excited by a silent discharge has been analysed to identify which of the luminescent centres are optically active upon the recombination of electrical charges and could therefore act as charge traps. Finally, the electroluminescence spectrum has been acquired and compared with the previous ones. Although the identification of the origin of these emissions is far from being complete, it has been found that the photoluminescence from the cured resin is due to in-chain chromophores, which acts as trapping centres. The excited states involved in photoluminescence also seems to be involved in electroluminescence, but other components are detected as well, which could be due to the degradation of the resin molecule under the effect of the electric stress.
DOI Link: 10.1088/0022-3727/34/16/320
ISSN: 0022-3727
Links: http://iopscience.iop.org/article/10.1088/0022-3727/34/16/320/meta
http://hdl.handle.net/2381/4067
Type: Article
Rights: This is an author-created, un-copyedited version of an article accepted for publication in Journal of Physics D: Applied Physics, 2001, 34 (16), pp. 2534-2540. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The definitive publisher authenticated version is available online at http://www.iop.org/EJ/abstract/0022-3727/34/16/320. Doi: 10.1088/0022-3727/34/16/320.
Appears in Collections:Published Articles, Dept. of Engineering

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