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|Title:||Towards an understanding of nanometric dielectrics.|
|Authors:||Nelson, J. Keith|
Fothergill, John C.
Dissado, Len A.
|Publisher:||Institute of Electrical and Electronics Engineers (IEEE)|
|Citation:||Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on, CEIDP 20-24 Oct. 2002, pp. 295 - 298.|
|Abstract:||Dielectric studies are described aimed at providing an understanding of the charge storage and transport of an epoxy resin containing TiO2 nanoparticles. Comparative results for conventionally filled composites are given, and the results discussed in terms of the underlying physics. It is shown that nanometric fillers mitigate the interfacial polarization characteristic of conventional materials with a reduction in the internal field accumulations.|
|Rights:||This is the author's final draft of the paper published as Annual Report of the Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, 2002, pp. 295-298. Doi: 10.1109/CEIDP.2002.1048793. Copyright © 2002 IEEE. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Leicester’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to firstname.lastname@example.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.|
|Appears in Collections:||Conference Papers & Presentations, Dept. of Engineering|
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