Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/4098
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dc.contributor.authorLees, J. E.-
dc.contributor.authorBassford, D. J.-
dc.contributor.authorNg, J. S.-
dc.contributor.authorTan, C. H.-
dc.contributor.authorDavid, J. P. R.-
dc.date.accessioned2008-11-27T12:34:23Z-
dc.date.available2008-11-27T12:34:23Z-
dc.date.issued2008-09-01-
dc.identifier.citationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2008, 594 (2), pp. 202-205.en_GB
dc.identifier.issn0168-9002-
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S0168900208008644en_GB
dc.identifier.urihttp://hdl.handle.net/2381/4098-
dc.description.abstractAl0.8Ga0.2As p+-p--n+ diodes with low reverse leakage currents (<10nA) were evaluated as room temperature (23ºC), soft X-ray photon counting detectors. X-ray spectra from a 55Fe radioactive source show these diodes can be used for spectroscopy with promising energy resolution of 1.47 keV FWHM at 5.9 keV. At elevated reverse bias levels (>20V) we observed avalanche multiplication which, while improving the signal-to-noise ratio, degraded the spectroscopic performance.en_GB
dc.language.isoenen_GB
dc.publisherElsevier B.V.en_GB
dc.rightsThis is the author's final draft of the paper published as Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2008, 594 (2), pp. 202-205. The final published version is available at http://www.sciencedirect.com/science/journal/01689002, Doi: 10.1016/j.nima.2008.06.038.-
dc.subjectX-ray detectionen_GB
dc.subjectAlGaAsen_GB
dc.subjectavalanche multiplicationen_GB
dc.titleAlGaAs diodes for X-ray spectroscopy.en_GB
dc.typeArticleen_GB
dc.identifier.doi10.1016/j.nima.2008.06.038-
dc.relation.deptSpace Projects and Instrumentation-
Appears in Collections:Published Articles, Dept. of Physics and Astronomy

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