Please use this identifier to cite or link to this item:
Title: Narrow-band X-ray polarizing filters.
Authors: Martindale, A.
Bannister, N.P.
Harris, K.D.M.
Solan, G.A.
Collins, S.P.
Champouret, Y.
Muppidi, V.K.
Fraser, G.W.
Roy, Mervyn
First Published: 2007
Publisher: Society of Photo-optical Instrumentation Engineers (SPIE)
Citation: Proceedings of SPIE, 2007, 6686, 66860X.
Abstract: We review past and current attempts to measure X-ray polarization in celestial sources and describe research activity into a new family of materials which have been shown to exhibit linear dichroism at X-ray wavelengths. Such materials could add a polarimetry capability to the high energy resolution detectors proposed for future, high effective area, X-ray astrophysical observatories such as Constellation-X and XEUS. They have the potential to achieve useful minimum detectable polarization values for a number of sources in a sensible exposure time with XEUS.
ISSN: 0277-786X
Type: Article
Description: This is the author's final draft of the paper published as Proceedings of SPIE, 2007, 6686, 66860X. The final version is available from Copyright 2007 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. Doi: 10.1117/12.734114
Appears in Collections:Published Articles, Dept. of Physics and Astronomy

Files in This Item:
File Description SizeFormat 
spie-6686-66860x-2007.pdf120.37 kBAdobe PDFView/Open

Items in LRA are protected by copyright, with all rights reserved, unless otherwise indicated.