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|Title:||Narrow-band X-ray polarizing filters.|
Bannister, N. P.
Harris, K. D. M.
Solan, G. A.
Collins, S. P.
Muppidi, V. K.
Fraser, G. W.
|Publisher:||Society of Photo-optical Instrumentation Engineers (SPIE)|
|Citation:||Proceedings of SPIE, 2007, 6686, 66860X.|
|Abstract:||We review past and current attempts to measure X-ray polarization in celestial sources and describe research activity into a new family of materials which have been shown to exhibit linear dichroism at X-ray wavelengths. Such materials could add a polarimetry capability to the high energy resolution detectors proposed for future, high effective area, X-ray astrophysical observatories such as Constellation-X and XEUS. They have the potential to achieve useful minimum detectable polarization values for a number of sources in a sensible exposure time with XEUS.|
|Rights:||This is the author's final draft of the paper published as Proceedings of SPIE, 2007, 6686, 66860X. The final version is available from http://spiedl.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=PSISDG00668600000166860X000001&idtype=cvips&gifs=yes&ref=no. Copyright 2007 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. Doi: 10.1117/12.734114|
|Appears in Collections:||Published Articles, Dept. of Physics and Astronomy|
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