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Please use this identifier to cite or link to this item: http://hdl.handle.net/2381/7604

Title: The effects of self assembled dot geometry in Auger recombination rates.
Authors: Chaney, Darren
Roy, Mervyn
Maksym, P.A.
Long, F.
Issue Date: 2003
Publisher: Institute of Physics
Citation: Physics of semiconductors 2002 : proceedings of the 26th International Conference on the Physics of Semiconductors held in Edinburgh, UK, 29 July-2 August 2002 / edited by A.R. Long and J.H. Davies, published by Institute of Physics, 2003.
Series/Report no.: Institute of Physics conference series
No. 171
ISBN: 0750309245
9780750309240
Links: http://www.iop.org/Conferences/Conference%20P(...)
http://hdl.handle.net/2381/7604
Type: Book chapter
Description: This paper was published in: Physics of semiconductors 2002 : proceedings of the 26th International Conference on the Physics of Semiconductors held in Edinburgh, UK, 29 July-2 August 2002 / edited by A.R. Long and J.H. Davies, published by Institute of Physics, 2003. It is available from http://www.iop.org/Conferences/Conference%20Proceedings/index.html
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Appears in Collections:Books & Book Chapters, Dept. of Physics and Astronomy

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