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Title: Statistical behavior of electrical breakdown in insulating polymers
Authors: Wu, Kai
Wang, Yang
Cheng, Yonghong
Dissado, Len A.
Liu, Xiaojun
First Published: 15-Mar-2010
Publisher: American Institute of Physics
Citation: Journal of Applied Physics, 2010, 107, 064107.
Abstract: A simulation model to investigate the statistical property of electrical breakdown is presented based on the field-assisted percolation model for dielectric breakdown, by expressing the disorder in morphology as randomly distributed trap barriers. The effects of sample area and large defects on the statistical property of breakdown are also studied, and the statistical behavior of the lifetime is investigated by considering the stochastic development of deteriorated regions. In addition an equation describing the breakdown probability in homogeneous materials is derived from percolation theory, which we show fits well to the simulation data. The breakdown probability is expressed in terms of trap distribution, and thus provides a way to connect the disorder in polymer morphology with the stochastic nature of breakdown.
DOI Link: 10.1063/1.3342468
ISSN: 0021-8979
eISSN: 1089-7550
Version: Publisher Version
Status: Peer reviewed
Type: Article
Rights: Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 2010, 107, 064107 and may be found at Deposited with reference to the publisher's archiving policy available on the SHERPA/RoMEO website.
Appears in Collections:Published Articles, Dept. of Engineering

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