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Title: Determination of the Residual Stress Field around Scratches Using Synchrotron X-Rays and Nanoindentation
Authors: Khan, M.K.
Fitzpatrick, Michael E.
Edwards, L.E.
Hainsworth, Sarah V.
First Published: 2010
Publisher: Trans Tech Publications
Citation: Materials Science Forum, 2010, 652, pp. 25-30.
Abstract: The residual strain field around the scratches of 125µm depth and 5µm root radius have been measured from the Synchrotron X-ray diffraction. Scratches were produced using different tools in fine-grained aluminium alloy AA 5091. Residual stresses up to +1700 micro-strains were measured at the scratch tip for one tool but remained up to only +1000 micro-strains for the other tool scratch. The load-displacement curves obtained from nanoindentation were used to determine the residual stresses around the scratches. It was found that the load-displacement curves are sensitive to any local residual stress field present and behave according to the type of residual stresses. This combination of nanoindentation and synchrotron X-rays has been proved highly effective for the study of small-scale residual stresses around the features such as scratches.
ISSN: 0255-5476
Type: Article
Description: This paper was published as Materials Science Forum, 2010, 652, pp. 25-30. It is available from Doi: 10.4028/www.scientificnet/MSF.652.25
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Appears in Collections:Published Articles, Dept. of Engineering

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