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|Title:||Determination of the Residual Stress Field around Scratches Using Synchrotron X-Rays and Nanoindentation|
Fitzpatrick, Michael E.
Hainsworth, Sarah V.
|Publisher:||Trans Tech Publications|
|Citation:||Materials Science Forum, 2010, 652, pp. 25-30.|
|Abstract:||The residual strain field around the scratches of 125µm depth and 5µm root radius have been measured from the Synchrotron X-ray diffraction. Scratches were produced using different tools in fine-grained aluminium alloy AA 5091. Residual stresses up to +1700 micro-strains were measured at the scratch tip for one tool but remained up to only +1000 micro-strains for the other tool scratch. The load-displacement curves obtained from nanoindentation were used to determine the residual stresses around the scratches. It was found that the load-displacement curves are sensitive to any local residual stress field present and behave according to the type of residual stresses. This combination of nanoindentation and synchrotron X-rays has been proved highly effective for the study of small-scale residual stresses around the features such as scratches.|
|Description:||This paper was published as Materials Science Forum, 2010, 652, pp. 25-30. It is available from http://www.scientific.net/MSF.652.25. Doi: 10.4028/www.scientificnet/MSF.652.25|
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|Appears in Collections:||Published Articles, Dept. of Engineering|
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